The Nikon XT H 225 ST 2x is an advanced X-ray imaging system developed by Nikon Metrology. It is specifically designed for industrial applications that require non-destructive testing and analysis of internal structures of different materials.

This X-ray system utilizes a high-resolution detector and X-ray source to generate detailed images of objects' internal features. It is used across various industries such as automotive, aerospace, electronics, and more, where quality control and inspection of components and materials are essential.

The Nikon XT H 225 ST 2x offers a magnification capability of up to 2x, enabling users to obtain highly detailed images of small or intricate samples. This feature comes in handy when inspecting fine structures or components that require closer examination.

The system's user-friendly interface and advanced image processing algorithms enhance the usability and efficiency of the analysis process. It allows operators to manipulate and analyze the acquired X-ray images, making precise measurements, identifying defects or flaws, and conducting thorough evaluations of the internal structures without causing any damage to the inspected samples.

With its versatile design, the Nikon XT H 225 ST 2x can accommodate a range of sample sizes and types, making it suitable for various applications. It is known for its reliable performance, accurate results, and its ability to provide valuable insights for quality control, research, and failure analysis purposes in industrial settings